INTEGRATED CIRCUIT RELIABILITY ENGINEERING: Failure Mechanisms Lifetime Modeling and Qualification Methodologies

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INTEGRATED CIRCUIT RELIABILITY ENGINEERING: Failure Mechanisms Lifetime Modeling and Qualification Methodologies

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  • 9798245385679

Independently Published

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Semiconductor Integrated Circuit: Device Design, Modeling, Simulation, and Application

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SOFTWARE FATIGUE MECHANISMS: Long term reliability decay unrelated to hardware failure

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