MICROELECTRONIC FAILURE ANALYSIS and DIAGNOSTICS: Physical Inspection Techniques Root Cause Identification Reliability Improvement

Independently Published
MICROELECTRONIC FAILURE ANALYSIS and DIAGNOSTICS: Physical Inspection Techniques Root Cause Identification Reliability Improvement

Image de MICROELECTRONIC FAILURE ANALYSIS and DIAGNOSTICS: Physical Inspection Techniques Root Cause Identification Reliability Improvement

Prix à partir de

12,92

En vedette

	12,92 €	Voir l’offre
	12,92 €	Voir l’offre

Description

Amazon MICROELECTRONIC FAILURE ANALYSIS AND DIAGNOSTICS: Physical Inspection Techniques Root Cause Identification and Reliability Improvement

Comparer les boutiques en ligne (2)

Shop

Prix

Affranchissement

Prix total

12,92 €

3,00 €

15,92 €

Voir l’offre

3,00 €

12,92 €

3,00 €

15,92 €

Voir l’offre

3,00 €

Description (1)

MICROELECTRONIC FAILURE ANALYSIS AND DIAGNOSTICS: Physical Inspection Techniques Root Cause Identification and Reliability Improvement

Spécifications du produit

Marque	Independently Published
EAN	9798252080468

Prix mis à jour pour la dernière fois le : 06-06-2026, 07:28

Independently Published

The Postmortem Playbook: Root Cause, Follow Through, and Reliability at Scale

34,12 €

Comparer 2 magasins 2 magasins

Independently Published

The Postmortem Playbook: Root Cause, Follow Through, and Reliability at Scale

23,35 €

Comparer 2 magasins 2 magasins

Independently Published

Quality Engineer Logbook: A Detailed Logbook for Tracking Non-Conformances, Root Cause Analysis...

7,26 €

Comparer 2 magasins 2 magasins

LAP LAMBERT Academic Publishing

Reliability and Failure Analysis of Novel Lead free Solders. 2nd Ed.

68,90 €

Comparer 2 magasins 2 magasins

Choix en vedette

12,92 €

Voir l’offre