Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Name: Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
Brand: Wiley
SKU: 5ba846412c89b6665aa425e15770b176

1/1

Prix à partir de

46,95

Liens sponsorisés

	46,95 €	Voir l’offre
	46,95 €	Voir l’offre
COMPARER TOUS LES MAGASINS EN LIGNE (2)

Description

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Comparer les boutiques en ligne (2)

Liens sponsorisés · Certaines boutiques nous versent une rémunération

Trier par:

46,95 € 0,01 € de livraison Total 46,96 €

Description (0)

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization

Marque	Wiley
EAN	9781606507278 9780470016084

LAP LAMBERT Academic Publishing

Sustainable Functional Materials: From Characterization to Application

Eliva Press

Macrocyclic Metal Complexes: From Synthesis to Biological Activity: Synthesis, Spectroscopic Characterization, Structural...

Blackwell Verlag GmbH

Practical Guide to Materials Characterization: Techniques and Applications

LAP LAMBERT Academic Publishing

Metal Oxide thin FILMS FOR Supercapacitor: SYNTHESIS AND CHARACTERIZATION OF MANGANESE COBALT...

Choix en vedette

46,95 €

Voir l’offre