Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Prix à partir de
65,96

En vedette

COMPARER TOUS LES MAGASINS EN LIGNE (2)

Description

Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Description Description
Product Specifications Spécifications du produit
Résultats connexes Résultats connexes
Next
Previous

Comparer les boutiques en ligne (2)

Shop
Prix
Affranchissement
Prix total
Amazon Logo
65,96 €
0,01 €
65,97 €
Voir l’offre
0,01 € Shipping Costs
Amazon Marketplace Logo
65,96 €
0,01 €
65,97 €
Voir l’offre
0,01 € Shipping Costs
Description (0)

Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Spécifications du produit

Marque LAP LAMBERT Academic Publishing
EAN
  • 9786630234442

Routledge

IIIV Compound Semiconductors

79,23 €
Comparer 2 magasins 2 magasins

Blackwell Verlag GmbH

Iron Group Metal Compound Nanomaterials: Preparation, Characterization, Structure, and Applications

158,07 €
Comparer 2 magasins 2 magasins

ICON Group International, Inc.

The 2027-2032 World Outlook for Communication and Technology Compound Semiconductors

1.025,00 €
Comparer 2 magasins 2 magasins

KIT Scientific Publishing

Effect of hybridization in CoDico FRTPs: Orientation dependent characterization and analytical modeling...

47,00 €
Comparer 2 magasins 2 magasins
Choix en vedette
65,96 €
Voir l’offre